Tuesday 7 June 2011

Test metrics


 Various Test metrics commonly used in software projects are:

(A) The Defects per project phase metric, provides a general comparison of defects found in each project phase. This metric is usually shown as appear graph with the project phase on the X-axis, the number of defects on the Y-axis.

(B) The mean Defect discovery rate metric, weighs the number of defects found on a day-by-day basis over the course of the project. This is a standard and useful tool to determine whether a specific project is going, according to a projected defect discovery rate (based on previous projects and industry averages).

(C) The Defect resolution rate, tracks the time taken to resolve defects from the time that they are identified. This can be used to predict release dates by calculating the amount of time required to solve the remaining problems presently in the project.

(D) Defect age, is used to measure how effective the review and inspection process. A defect that was introduced in the scope or requirements phase but not discovered until testing is far more costly to fix than, if it would have been caught in early process. So the mean defect age should be as low as possible.

(E) The percentage of engineering effort metric, compares how software effort (in man hours) and actual calendar time break down into project phases. These two measurements will be useful in determining where additional training, staff, or process improvement is needed. This metric measures the average number of man-hours spent in each project phase. A project manager can use this measurement to gauge whether the effort is being used efficiently over the course of the project schedule.                                                         

(F) Defect density, measures the number of defects per KLOC (thousand lines of code). It is often used to determine whether the software is ready for release. A test plan may have a maximum defect density listed in the acceptance criteria. Which requires that the software should not contain any critical or high priority defects & contain less than a specific number of low priority defects per KLOC . 


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